May 3, 2007

From STDFGroup

STDF Scan datalog meeting Notes

Date: 3rd May 2007

Attendees:

Ajay Khoche -- Verigy

Cy Hay -- Synopsys

Mary Israni -- BCS

Glenn Plowman -- Qualcomm

Andreas Leininger -- Infineon

Gary Green -- Synopsys

Tom Bartenstien -- Cadence

Darrel Carder -- Freescale

Wu Yang -- Mentor Graphics

Ping Wen -- Yield Dynamics

Agenda:

1. Discuss Phil's proposal for Test Pattern Map
2. Discuss longer meeting dates/agenda

Minutes:

Phil's Proposal

• Group discussed the Test Pattern Map that Phil provided
• Following points came out of the discussions
  • Cy(Synopsys) proposed using "padding" keyword instead of "offset"
  • There is an issue on how to gather the information to construct the Test Pattern Map. The consesus was the format should provide syntax for providing it the tools and the mechanism to construct should be left for the implementation and tools involved.

longer meeting dates/agenda

• The longer meeting would be held on May 22nd from 8.00AM-12.00(noon). This is a change from the earlier agreed date (17th May)
• Following topics were proposed for discussions during the meeting
  • Data Model:
    • Environment
    • Format specifications
    • Validation & Synchronization(With handling of buffer full condition)
    • Fail Data
  • Merging data model objects, if there is overlap in contents or intent
  • Example creation: Group to work on creating examples based on the discussions held so far.
  • Single v/s multiple STDF file
  • Self-contained vs reliance on other STDF records
  • Various information classes and frequency of dumps

Next Meeting:

• Next meeting on May 22nd.

New Action Items:

• Prepare for Longer meeting - All