Mar 8, 2007

STDF Scan datalog meeting Notes

Date: 8 Feb 2007

Attendees:

Ajay Khoche Verigy

Phil Burlinson Inovys

Cy Hay Synopsys

Andreas Leininger Infineon

John Rowe Teradyne

Mary Israni BCS

Claire Faydide ST

Gary Green Synopsys

Tom Jackson Cadence

Burnie West Open tools

Wu Yang Mentor Graphics

Agenda:

Minutes:

Discussion pattern source file identification

Phil presented his proposal (proposal in on the web for reference); Following points were observed/discussed
- Need for pattern source file identification for consistency
- Need for multiple files for a pattern is also confirmed as multiple source files could make up a pattern for a test suite.
- Various mechanism can be used for correctly identifying the source file a combination of name, date of creation, size, CC etc, these mechanisms should be extensible
- Support for the pattern based logging should still be supported on an optional basis for synchronization which patterns from the file were really applied in a test.

John mentioned brining TestInsight into the discussion on this topic and the group's resolution was that we should bring them in when we have a proposal.
Ajay asked if many members of the group are going to attend VTS so we can plan a face to face meeting

Next Meeting:

Next meeting on Mar 22^nd^.
We will finish presentations from Mentor and Cadence on Test identification to wrap up this topic and roll the findinds into the data model document.

New Action Items: