Mar 22, 2007

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STDF Scan datalog meeting Notes

Date: 22nd Mar 2007


Attendees:


Ajay Khoche -- Verigy

Cy Hay -- Synopsys

John Rowe -- Teradyne

Phil Burleson -- Inovys

Darrel Carder -- FreeScale

Gary Green -- Synopsys

Craig -- Cadence

Wu Yang -- Mentor Graphics

Agenda:

  1. Discuss Cadence's Test Identification terminology


Minutes:

  • Group discussed the Test Identification terminologies used by Cadence
  • The terminology is very consistent with the other EDA companies
  • Following points were observed
    • Need multiple Test Mode identification: 27 test modes are used at IBM in one example
    • Need for initilization procedure were mainly for internall PLL setteling. Older devices used to wait for lock signal. However newer devices use a fixed wait.
    • Encounter supports both core based as well as flattened tests
      • Diagnostics tools will have to adjust to support both IP based and flattened view
      • In case of IP based datalog, IP identificatin will have be supported.
    • Need to make sure that cycle counts are consistent accross STIL and WGL


New Action Items:

  • look for possibility to have a face-2-face mtg at VTS- Ajay
  • Review data model document - All
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