Apr 5, 2007
From STDFGroup
STDF Scan datalog meeting Notes
Date: 5th Apr 2007
Attendees:
Ajay Khoche Verigy
Cy Hay Synopsys
Glenn Plowman Qualcomm
John Rowe Teradyne
Mary Israni BCS
Gary Green Synopsys
Rohit Kapur Synopsys
Greg Float Cadence
Darrel Carder Freescale
Wu Yang Mentor Graphics
Agenda:
- Review Mentor's requirement
- Discuss Darrel's email
Minutes:
Review Mentor's requirement
- Wu Yang presented Mentor' requirements for test terminology and Diagnostics. The requirements and terminology was similar to that of Synopsys and Cadence. There were no discussions.
Discuss Darrel's email
- A mechanism is needed for pin name mapping as the pin names get morphed during the test program generation phase. It is a big issue at Freescale
- We need to handle non ATPG based pattern addition. A pattern map will be needed
- Phil will provide an example to the group
Next Meeting:
- Next meeting on Apr 19th
- We will discuss Darrel's email and other test identification issues
New Action Items:
- Provide an example of the pattern map - Phil
