Apr 19, 2007
From STDFGroup
STDF Scan datalog meeting Notes
Date: 19 Apr 2007
Attendees:
Ajay Khoche Verigy
Cy Hay Synopsys
John Rowe Teradyne
Mary Israni BCS
Gary Green Synopsys
Tom Bartenstien Cadence
Darrel Carder Freescale
Wu Yang Mentor Graphics
Ping Wen Yield Dynamics
Agenda:
- Discuss face-2-face mtg possisbility at VTS
- Discuss Darrel's email
Minutes:
Face-2-Face meeting at VTS
- There are not enough working group members that can attend at VTS so the face-2-face meeting isnot scheduled at VTS. The need for face to meeting will be reassed in May
- A longer meeting from 8.00AM-12.00PM would rather be scheduled on 17th May to cover more ground. Agenda for the May 17th meeting to be decided in the next meeting.
Discuss Darrel's email
- A mechanism is needed for pin name mapping as the pin names get morphed during the test program generation phase
- A mechanism is needed to detect modification at ATE in any test
- the solution is not clear at the moment. It is not clear as to how much data is required to detect such change
- Need to decide how to handle outputs that are X'd at the tester. Do we need to keep this information in the log or do we accept the accuracy loss
- Start index for the cycle or pattern would be 0 in the standard.
Next Meeting:
- Next meeting on May 2^nd^.
- We will discuss the example that Phil provided
New Action Items:
- Schedule the May 17th meeting - Ajay
- Review data model document - All
